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Czochralski Growth of Germanium Single Crystals
Ezheiyan, Mahdi; Sadeghi, Hosein
Department of Physics, Malek Ashtar University of technology, shahinshahr
Abstract
Germanium crystals with 99.999 percent purity and good quality for optical usage in the range of 2 – 12 micro
meters successfully were grown. Analyses that performed for quality determination of grown crystals indicates that
they are single crystals, surface density of dislocations is sufficient for optical applications, transmission percent
for IR waves usage in the range of 2 – 12 micro meters is good and their ability of cutting and polishing is also
sufficient.
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[1] Ricardo Jaramillo, "Single crystal growth and analysis of
Germanium", M. E. thesis, Concorida University, Montreal Canada.
(1989).
[2] B. M. Park, G.H. Seo, G. Kim; “Nitrogen-doping effect in a fastpulled Cz-Si single crystal”; J. Crystal Growth 222 (2001) 74.
[3] W. Xu, J. Chen, X. Ma, D. Yang, L. Gong and D. Tian; “Flow
pattern defects in germanium-doped Czochralski silicon crystals”, Appl
Phys A (2011) DOI 10.1007/s00339-010-6146-6.
[4] M.P. Volz ,M. Schweizer, B. Raghothamachar, M. Dudley, J. Szoke,
S.D. Cobb, F.R. Szofran; “X-ray characterization of detached-grown
germanium crystals”; Journal of Crystal Growth. 290 (2006) 446–451.
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